AS ISO 14606-2006
- standard by Standards Australia, 10/20/2006
- Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials
- Category: AS
$54.77
$28.00
Full Description
Adopts ISO 14606:2000 to give guidance on the optimization of sputter depth profiling parameters using appropriate single-layered and multi-layered reference materials in order to achieve optimum depth resolution as a function of instrument settings.
Product Details
- Edition:
- 1st
- Published:
- 10/20/2006
- ISBN(s):
- 0733777953
- Number of Pages:
- 15
- File Size:
- 1 file , 690 KB
- Product Code(s):
- 10148313, 10148302, 10148310
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
